- Test Applications Using an Automated Near Field Detection System -

We are pleased to invite you to “EMC Technical Webinar from Aprel” a webinar which will take place on Friday, November 18th from 10 am to 11:30 am (PST). The webinar is free to attend.

We are honored to have Stuart Nicol with Aprel as our guest speaker. He will be presenting “Test Applications Using an Automated Near Field Detection System”

Abstract:

“Test Applications Using an Automated Near Field Detection System”
Stuart Nicol : Aprel

EM-ISight is a near-field EMC scanning system that can be used as an alternative for costly pre-compliance chambers and for de-bugging assemblies for noise sources. This webinar will cover some of the test applications which EM-ISight has been used and shown success in solving noise / emissions on complex electronic assemblies. Introduction to IEC-61967 and the application of EM-ISight and using EM-ISight to conduct de-sense testing for cellular and AGPS modes of operation shall be presented.

Guest Speaker:

Stuart Nicol
Aprel

Stuart Nicol has worked within the field of high technology/telecommunications for over 16 years both in Europe and North America. He has been the lead in all major automated system development programs at APREL including SAR (Specific Absorption Rate). HAC (Hearing Aid Compatibility) and EM-ISight (near field scanning). He has held many positions within the international standards development committees and is the current chairman for the Canadian delegation of IEC TC-106, he received his degree in the United Kingdom (electronic and manufacturing engineering) and is the CEO of APREL.

*Pre-registration is required to attend the seminar

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