We are pleased to invite you to “EMC Test Seminar at Tektronix,” an event which will take place on 5/8 Tuesday from 10:00 am to 3:00 pm at Tektronix Santa Clara. The seminar is free to attend and lunch will be provided. We are honored to have four guest speakers from leading EMC testing related companies, Dan Brooks from Aprel, Bob Hiebert from Tektronix, Randy Johnson from Teseq and David Seabury from Panashield to present the latest EMC testing technologies and standards.“1. Far Field Approximation Using Broadband Near field Probe Techniques”
Traditional methods for establishing EMC and field density can be predicted using a filed approximation routine based on well documented principles. In the process of reducing spurious emissions or EMC interference engineers will use suppression techniques of shields, boxes, and cages. These methods have been found to work in normal applications but as the frequency expands traditional methods of EMC suppression may not be as effective. The far field approximation technique allows an engineer to test a sub assembly in the reactive near field and then have a value which is extrapolated to the far field based on measurements taken using the broadband near field probe technique and then extrapolate to either a 3M or 10M space. Such a technique can allow the design engineer to determine the effectiveness of their design prior to final integration into an assembly thus understanding better the uncertainties of a previously developed shielding effectiveness mechanism.
Speaker: Dan Brooks (Aprel)
Daniel Brooks holds a Bachelor of Applied Science degree in Electrical Engineering from the University of Ottawa and diploma in Electronics Technology from Radio College of Canada. He has conducted research and development work as senior RF Engineer with Aprel Inc. where he has authored several published technical papers and presented his research to technical committees and Symposium of the IEC and EMC international organizations. His expertise is in the applied radiometrics of wireless propagation and numerical analysis of complex radiating structures. Dan is a hands-on type of person that enjoys taking theoretical ideas into the laboratory and moving them into real-world engineering designs.
“2. EMI Diagnostics – Using Real-Time Signal Analysis Technology”
The historically developed methods of measurements have limitations in today’s complex signal environment. Bursted and frequency hopping signals in an ever more crowded spectrum make identifying and isolating interference difficult, time consuming, and expensive. We will discuss how Real-Time technology can be used to rapidly capture and identify intermittent signals. Finally, we will look at a common diagnostics application and see how the capabilities of Real-Time Signal Analysis technology can be used to reduce troubleshooting time in EMC diagnostics.
Speaker: Bob Hiebert (Tektronix)
Mr. Hiebert is currently the director of business development for the Americas for Tektronix’s Sources and Analyzers business. In his 29 years in Test and Measurement he has had roles in marketing, engineering, and general management, working with a test and measurement technologies from DC to light.
“3. Future Standard Changes for IEC 61000 4-4 (EFT) & 4-5 (Surge)”
This presentation will explore future changes for the IEC 61000 EFT & Surge standards that may be occurring in the next few years. A brief review of EFT & Surge testing will also be included.
Speaker: Randy Johnson (Teseq)
Randy Johnson has been working in the EMC marketplace for over 30 years. He was co-owner of Loren Green Associates, a respected Manufacturer’s Rep company in Chicago, IL. Since 2004, Randy has been a Sales Manager at Schaffner Test Systems, now known as Teseq Inc. Randy was part of the management buyout of Teseq in 2007. Randy has been directly involved with customers in engineering/meeting their test equipment, systems & EMC software requirements for Commercial & Automotive applications.
“4. Trends in Anechoic Chamber Implementation – New materials and standards”
A general discussion regarding recent changes in anechoic chamber construction due to new anechoic materials and changes to international specifications. We all are driven by the new EMC regulations and requirements, which impact performance within the chambers. CISPR 16-1-4 will be discussed as having the most impact. Also reviewed will be MIL 461, DO-160 and CISPR 25 upgrades and the more common use of ferrite hybrid treatments.
Speaker: David Seabury (Panashield)
David Seabury has been working in the EMC marketplace for over 20 years. He founded IBEX Group in 1990 and in 1992 built the first all ferrite 3m chamber in the USA that met the new FCC NSA requirements. In 1992 he started a joint US operation with Chase EMC which was subsequently sold to Schaffner now TESEQ. From 2002 through 2010 he was a Senior Product Manager for ETS-Lindgren and in 2011 joined with Panashield as their Director of Sales. David has been directly involved with the design and construction of hundreds of anechoic chambers for commercial, military and aero-space applications
*Pre-registration is required to attend the seminarEvent:
|Date:||May 8, 2012|
|Registration:||9:30am – 10:00am|
|Seminar:||10:00am – 3:00pm|
|Venue:||Tektronix Santa Clara: 2575 Augustine Drive Santa Clara, CA 95054 | Map|
|10:00am – 11:30pm||“Far Field Approximation Using Broadband Near field Probe Techniques”|
|11:30pm – 12:00pm||“EMI Diagnostics – Using Real-Time Signal Analysis Technology”|
|12:00pm – 1:00pm||Lunch Break|
|1:00pm – 1:45pm||“Future Standard Changes for IEC 61000 4-4 (EFT) & 4-5 (Surge)”|
|1:45pm – 2:30pm||“Trends in Anechoic Chamber Implementation – New materials and standards”|
|2:30pm – 3:00pm||Q&A|