“Source Reconstruction for IC Radiated Emissions from Measurements”

Integrated circuits are the ultimate noise source for many system-level EMI and intra-system interference issues. Suitable equivalent sources for ICs are critical for EMC analysis and modeling.  This talk introduces two equivalent source reconstruction methods for IC radiated emissions: TEM cell based and near-field scanning based. The choices of source models and reconstruction approaches are discussed. Physical meaning of the equivalent sources is important to ensure the validity of the follow-on analysis and modeling, and therefore is particularly emphasized in developing the reconstruction approaches.

BIO

Prof. Jun Fan
Assistant Professor, Missouri University of Science and Technology

Jun Fan (S’97-M’00-SM’06) received his B.S. and M.S. degrees in Electrical Engineering from Tsinghua University, Beijing, China, in 1994 and 1997, respectively. He received his Ph.D. degree in Electrical Engineering from the University of Missouri-Rolla in 2000. From 2000 to 2007, he worked for NCR Corporation, San Diego, CA, as a Consultant Engineer. In July 2007, he joined the Missouri University of Science and Technology (formerly University of Missouri-Rolla), and is currently an Assistant Professor with the Missouri S&T EMC Laboratory. His research interests include signal integrity and EMI designs in high-speed digital systems, dc power-bus modeling, intra-system EMI and RF interference, PCB noise reduction, differential signaling, and cable/connector designs. Dr. Fan served as the Chair of the IEEE EMC Society TC-9 Computational Electromagnetics Committee from 2006 to 2008, and was a Distinguished Lecturer of the IEEE EMC Society in 2007 and 2008. He currently serves as the Vice Chair of the Technical Advisory Committee of the IEEE EMC Society. Dr. Fan received an IEEE EMC Society Technical Achievement Award in August 2009.