We are honored to have Stuart Nicol with Aprel as our guest speaker. He will be presenting “Test Applications Using an Automated Near Field Detection System”. In addition APREL will demonstrate the features and functions of EM-ISight-2 automated near field scanning system which will operate from 10kHz to 20GHz. The demonstrations will be made using applications relevant to research, test, measurement and design optimization. EM-ISight-2 will incorporate the latest version of Tektronix RSA6120A real time spectrum analyzer where a complete demonstration of unique features included in the APRELEM-ISight software package will be shown. We will also have David Huynh with Tektronix present “EMI Diagnostics:Using Real-time Signal Analysis Technology” and Yoshi Fukawa with TechDream on “EMI Reduction Methodology using EMIStream”.

Abstract:

“1. Test Applications Using an Automated Near Field Detection System”

EM-ISight is a near-field EMC scanning system that can be used as an alternative for costly pre-compliance chambers and for de-bugging assemblies for noise sources. This webinar will cover some of the test applications which EM-ISight has been used and shown success in solving noise / emissions on complex electronic assemblies. Introduction to IEC-61967 and the application of EM-ISight and using EM-ISight to conduct de-sense testing for cellular and AGPS modes of operation shall be presented.

Guest Speaker:

Stuart Nicol
Aprel

Stuart Nicol has worked within the field of high technology/telecommunications for over 16 years both in Europe and North America. He has been the lead in all major automated system development programs at APREL including SAR (Specific Absorption Rate). HAC (Hearing Aid Compatibility) and EM-ISight (near field scanning). He has held many positions within the international standards development committees and is the current chairman for the Canadian delegation of IEC TC-106, he received his degree in the United Kingdom (electronic and manufacturing engineering) and is the CEO of APREL.

“2. EMI Diagnostics:Using Real-time Signal Analysis Technology”

Electromagnetic emissions and interference (EMI) are by their very nature unwanted, semi-random, and often are detected at the most inopportune time. Traditional swept spectrum analyzers require narrow resolution bandwidth settings in order to detect the lowest level signals emitted by a device under test. When swept across wide frequency ranges to perform emission measurements, swept spectrum analyzers not only take many minutes, but they also might not display random occurrences that appear within the spectrum if the analyzer “missed” the moment at which the random signal appeared. Tektronix’s patented DPX technology allows engineers to see signals within signals and capture live RF the moment signals appear. Revolutionary Tektronix Real Time Spectrum Analyzer (RSA) technology also makes low level emissions and spurious measurements up to 10x faster than traditional swept spectrum analyzers, which makes the RSA an ideal diagnostic tool to capture, trigger, and analyze sources of unwanted EMI.

Guest Speaker:

David Huynh
Tektronix

David Huynh has worked in the Wireless Communication space since 2005. His past roles entailed Field Applications and Product Marketing Engineering at Agilent Technologies. He is currently a Business Development Manager with Tektronix. David received his BSEE and MSEE from the University of California, San Diego and Stanford University respectively. He also recently obtained his MBA from the Harvard Business School.

About EMT Labs
EMT is one stop for test and international approval lab . We offer ITE, medical, wireless telephone interface product testing and get international approval in a timely manner.

*Pre-registration is required to attend the seminar

EVENT:

Guest Speakers:	Stuart Nicol (Aprel), David Huynh (Tektronix)
Date:	February 23-24, 2012
Open House:	10:00am – 4:00pm
Lunch Workshop:	11:30am – 1:00pm
Venue:	EMT Labs: 1547 Plymouth Street Mountain View, CA 94043 | Map

AGENDA:

10:00am – 11:30am	Open House
11:30am – 11:40am	“EMT Labs Introduction: Services and Capabilities”
11:40am – 12:25pm	“Test Application Using an Automated Near Field Detection System” by Stuart Nicole
12:25pm – 12:45pm	“EMI Diagnostics:Using Real-time Signal Analysis Technology” by David Huynh
12:45pm – 1:15pm	“EMI Reduction Methodology using EMIStream” by Yoshi Fukawa
1:15pm – 4:00pm	Open House

EVENT REGISTRATION

Event Registration for EMC Open House at EMT Labs -

We exhibited at the EPEPS 2011 Conference which was held at the Doubletree Hotel in San Jose from October 24th to 25th. EPEPS is the premier international conference on advanced and emerging issues in electrical modeling, analysis and design of electronic interconnections, packages and systems.

- Test Applications Using an Automated Near Field Detection System -

We are pleased to invite you to “EMC Technical Webinar from Aprel” a webinar which will take place on Friday, November 18th from 10 am to 11:30 am (PST). The webinar is free to attend.

We are honored to have Stuart Nicol with Aprel as our guest speaker. He will be presenting “Test Applications Using an Automated Near Field Detection System”

Abstract:

“Test Applications Using an Automated Near Field Detection System”
Stuart Nicol : Aprel

EM-ISight is a near-field EMC scanning system that can be used as an alternative for costly pre-compliance chambers and for de-bugging assemblies for noise sources. This webinar will cover some of the test applications which EM-ISight has been used and shown success in solving noise / emissions on complex electronic assemblies. Introduction to IEC-61967 and the application of EM-ISight and using EM-ISight to conduct de-sense testing for cellular and AGPS modes of operation shall be presented.

Guest Speaker:

Stuart Nicol
Aprel

Stuart Nicol has worked within the field of high technology/telecommunications for over 16 years both in Europe and North America. He has been the lead in all major automated system development programs at APREL including SAR (Specific Absorption Rate). HAC (Hearing Aid Compatibility) and EM-ISight (near field scanning). He has held many positions within the international standards development committees and is the current chairman for the Canadian delegation of IEC TC-106, he received his degree in the United Kingdom (electronic and manufacturing engineering) and is the CEO of APREL.

*Pre-registration is required to attend the seminar

Event:

Guest Speaker:	Stuart Nicol (Aprel)
Date:	November 18, 2011
Webinar:	10:00 am – 11:30 am (PST)

Agenda:

10:00 am – 11:00 am	Test Applications Using an Automated Near Field Detection System
11:00 am – 11:30 am	Q & A

We are pleased to invite you to “EMC Technical Webinar” a webinar which will take place on Thursday, September 22nd from 10 am to 12 pm (PST). The webinar is free to attend.

We are honored to have Dr. Takashi Harada with NEC from Japan as our guest speaker. He will be presenting “Understanding EMI Suppression Mechanism by Visualization of Electromagnetic Field” We will also have vendor speaker, Mai Haines from TechDream.

Abstract:

“1. Understanding EMI Suppression Mechanism by Visualization of Electromagnetic Field”
Dr. Takashi Harada : NEC Corporation

The development of electromagnetic measurement and simulation technologies has enabled visualizing electromagnetic fields and its behaviors. By using these technologies we can better understand the physical mechanisms of EMI causing factors instead of just relying on experience or rule of thumb. This presentation describes the fundamental concept of EMI suppressing technology grounded on measurement and simulation.

Guest Speaker:

Dr. Takashi Harada
NEC Corporation

He received his M.E. degrees in electrical engineering from Tokyo Metropolitan University, Tokyo, Japan in 1983. He received his PhD. from The University of Electro-Communications in 2000. He joined NEC Corporation in 1983 and has been engaged in research on EMC (developing microwave wave absorber, anechoic chamber, shielding material and board design tool for reducing EMI), and Jisso (packaging) technologies. Now, he is a Senior Manager of System Jisso Research Laboratories, NEC Corporation. He is also a Guest Professor of Tokyo Institute of Technology. He is a member of IEEE, IEICE (The Institute of Electronics, Information and Communication Engineers Society). Japan Institute of Electronics Packaging.

“2. How to Suppress EMI Using EMIStream”
Mai Haines, Sales Engineer of TechDream

Making the correct changes at the PCB layout stage can be the easiest and most effective way to suppress EMI . See how easy it is to make the changes you need using EMIStream. We will show you how to set up and run EMIStream EMI Design Rule Check and Plane Resonance Analysis. See how your design review process can be shortened by using EMIStream .

*Pre-registration is required to attend the seminar

Event:

Guest Speaker:	Dr. Takashi Harada (NEC)
Date:	September 22, 2011
Webinar:	10:00 am – 12:00 pm (PST)

Agenda:

10:00 am – 11:00 am	Understanding EMI Suppression Mechanism by Visualization of Electromagnetic Field
11:00 am – 11:45 am	How to suppress EMI using EMIStream
11:45 am – 12:00 pm	Q & A