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We are pleased to invite you to “EMC Test Seminar at TUV America” an event which will take place on 5/11 Friday from 10:00 am to 2:30 pm at TUV America in San Diego. The seminar is free to attend and lunch will be provided. We are honored to have four guest speakers from leading EMC testing related companies, Dan Brooks from Aprel, Bob Hiebert from Tektronix, Randy Johnson from Teseq and David Seabury from Panashield to present the latest EMC testing technologies and standards.

Abstract:

“1. Far Field Approximation Using Broadband Near field Probe Techniques”

Traditional methods for establishing EMC and field density can be predicted using a filed approximation routine based on well documented principles. In the process of reducing spurious emissions or EMC interference engineers will use suppression techniques of shields, boxes, and cages. These methods have been found to work in normal applications but as the frequency expands traditional methods of EMC suppression may not be as effective. The far field approximation technique allows an engineer to test a sub assembly in the reactive near field and then have a value which is extrapolated to the far field based on measurements taken using the broadband near field probe technique and then extrapolate to either a 3M or 10M space. Such a technique can allow the design engineer to determine the effectiveness of their design prior to final integration into an assembly thus understanding better the uncertainties of a previously developed shielding effectiveness mechanism.

Speaker: Dan Brooks (Aprel)

Daniel Brooks holds a Bachelor of Applied Science degree in Electrical Engineering from the University of Ottawa and diploma in Electronics Technology from Radio College of Canada. He has conducted research and development work as senior RF Engineer with Aprel Inc. where he has authored several published technical papers and presented his research to technical committees and Symposium of the IEC and EMC international organizations. His expertise is in the applied radiometrics of wireless propagation and numerical analysis of complex radiating structures. Dan is a hands-on type of person that enjoys taking theoretical ideas into the laboratory and moving them into real-world engineering designs.

“2. EMI Diagnostics – Using Real-Time Signal Analysis Technology”

The historically developed methods of measurements have limitations in today’s complex signal environment. Bursted and frequency hopping signals in an ever more crowded spectrum make identifying and isolating interference difficult, time consuming, and expensive. We will discuss how Real-Time technology can be used to rapidly capture and identify intermittent signals. Finally, we will look at a common diagnostics application and see how the capabilities of Real-Time Signal Analysis technology can be used to reduce troubleshooting time in EMC diagnostics.

Speaker: Bob Hiebert (Tektronix)

Mr. Hiebert is currently the director of business development for the Americas for Tektronix’s Sources and Analyzers business. In his 29 years in Test and Measurement he has had roles in marketing, engineering, and general management, working with a test and measurement technologies from DC to light.

“3. Future Standard Changes for IEC 61000 4-4 (EFT) & 4-5 (Surge)”

This presentation will explore future changes for the IEC 61000 EFT & Surge standards that may be occurring in the next few years. A brief review of EFT & Surge testing will also be included.

Speaker: Randy Johnson (Teseq)

Randy Johnson has been working in the EMC marketplace for over 30 years. He was co-owner of Loren Green Associates, a respected Manufacturer’s Rep company in Chicago, IL. Since 2004, Randy has been a Sales Manager at Schaffner Test Systems, now known as Teseq Inc. Randy was part of the management buyout of Teseq in 2007. Randy has been directly involved with customers in engineering/meeting their test equipment, systems & EMC software requirements for Commercial & Automotive applications.

“4. Trends in Anechoic Chamber Implementation – New materials and standards”

A general discussion regarding recent changes in anechoic chamber construction due to new anechoic materials and changes to international specifications. We all are driven by the new EMC regulations and requirements, which impact performance within the chambers. CISPR 16-1-4 will be discussed as having the most impact. Also reviewed will be MIL 461, DO-160 and CISPR 25 upgrades and the more common use of ferrite hybrid treatments.

Speaker: David Seabury (Panashield)

David Seabury has been working in the EMC marketplace for over 20 years. He founded IBEX Group in 1990 and in 1992 built the first all ferrite 3m chamber in the USA that met the new FCC NSA requirements. In 1992 he started a joint US operation with Chase EMC which was subsequently sold to Schaffner now TESEQ. From 2002 through 2010 he was a Senior Product Manager for ETS-Lindgren and in 2011 joined with Panashield as their Director of Sales. David has been directly involved with the design and construction of hundreds of anechoic chambers for commercial, military and aero-space applications

*Pre-registration is required to attend the seminar

For more information contact Jim Baer with Comply Tek.
Email or call 858-674-6155

Event Registration:

Event Registration for EMC Test Seminar at TUV America -

We are pleased to invite you to “EMC Test Seminar at Intertek” an event which will take place on 5/10 Thursday from 1:00 pm to 5:00 pm at Intertek in Lake Forest. The seminar is free to attend. We are honored to have four guest speakers from leading EMC testing related companies, Dan Brooks from Aprel, Bob Hiebert from Tektronix, Randy Johnson from Teseq and David Seabury from Panashield to present the latest EMC testing technologies and standards.

Abstract:

“1. Far Field Approximation Using Broadband Near field Probe Techniques”

Traditional methods for establishing EMC and field density can be predicted using a filed approximation routine based on well documented principles. In the process of reducing spurious emissions or EMC interference engineers will use suppression techniques of shields, boxes, and cages. These methods have been found to work in normal applications but as the frequency expands traditional methods of EMC suppression may not be as effective. The far field approximation technique allows an engineer to test a sub assembly in the reactive near field and then have a value which is extrapolated to the far field based on measurements taken using the broadband near field probe technique and then extrapolate to either a 3M or 10M space. Such a technique can allow the design engineer to determine the effectiveness of their design prior to final integration into an assembly thus understanding better the uncertainties of a previously developed shielding effectiveness mechanism.

Speaker: Dan Brooks (Aprel)

Daniel Brooks holds a Bachelor of Applied Science degree in Electrical Engineering from the University of Ottawa and diploma in Electronics Technology from Radio College of Canada. He has conducted research and development work as senior RF Engineer with Aprel Inc. where he has authored several published technical papers and presented his research to technical committees and Symposium of the IEC and EMC international organizations. His expertise is in the applied radiometrics of wireless propagation and numerical analysis of complex radiating structures. Dan is a hands-on type of person that enjoys taking theoretical ideas into the laboratory and moving them into real-world engineering designs.

“2. EMI Diagnostics – Using Real-Time Signal Analysis Technology”

The historically developed methods of measurements have limitations in today’s complex signal environment. Bursted and frequency hopping signals in an ever more crowded spectrum make identifying and isolating interference difficult, time consuming, and expensive. We will discuss how Real-Time technology can be used to rapidly capture and identify intermittent signals. Finally, we will look at a common diagnostics application and see how the capabilities of Real-Time Signal Analysis technology can be used to reduce troubleshooting time in EMC diagnostics.

Speaker: Bob Hiebert (Tektronix)

Mr. Hiebert is currently the director of business development for the Americas for Tektronix’s Sources and Analyzers business. In his 29 years in Test and Measurement he has had roles in marketing, engineering, and general management, working with a test and measurement technologies from DC to light.

“3. Electric Vehicles 2012 Trends”

This presentation will explore EMC trends & concerns in current & future battery & hybrid electric vehicles. By moving to machines that require electricity, the automobile now needs to be tested to multiple standards, both automotive & IEC 61000 standards. A hybrid or electric car now has become another house appliance to be tested.

Speaker: Randy Johnson (Teseq)

Randy Johnson has been working in the EMC marketplace for over 30 years. He was co-owner of Loren Green Associates, a respected Manufacturer’s Rep company in Chicago, IL. Since 2004, Randy has been a Sales Manager at Schaffner Test Systems, now known as Teseq Inc. Randy was part of the management buyout of Teseq in 2007. Randy has been directly involved with customers in engineering/meeting their test equipment, systems & EMC software requirements for Commercial & Automotive applications.

“4. Trends in Anechoic Chamber Implementation – New materials and standards”

A general discussion regarding recent changes in anechoic chamber construction due to new anechoic materials and changes to international specifications. We all are driven by the new EMC regulations and requirements, which impact performance within the chambers. CISPR 16-1-4 will be discussed as having the most impact. Also reviewed will be MIL 461, DO-160 and CISPR 25 upgrades and the more common use of ferrite hybrid treatments.

Speaker: David Seabury (Panashield)

David Seabury has been working in the EMC marketplace for over 20 years. He founded IBEX Group in 1990 and in 1992 built the first all ferrite 3m chamber in the USA that met the new FCC NSA requirements. In 1992 he started a joint US operation with Chase EMC which was subsequently sold to Schaffner now TESEQ. From 2002 through 2010 he was a Senior Product Manager for ETS-Lindgren and in 2011 joined with Panashield as their Director of Sales. David has been directly involved with the design and construction of hundreds of anechoic chambers for commercial, military and aero-space applications

*Pre-registration is required to attend the seminar

For more information contact Jim Baer with Comply Tek.
Emailor call 858-674-6155

Event Registration:

Event Registration for EMC Test Seminar at Intertek -

Traditional methods for establishing EMC and field density can be predicted using a filed approximation routine based on well documented principles. In the process of reducing spurious emissions or EMC interference engineers will use suppression techniques of shields, boxes, and cages. These methods have been found to work in normal applications but as the frequency expands traditional methods of EMC suppression may not be as effective. The far field approximation technique allows an engineer to test a sub assembly in the reactive near field and then have a value which is extrapolated to the far field based on measurements taken using the broadband near field probe technique and then extrapolate to either a 3M or 10M space. Such a technique can allow the design engineer to determine the effectiveness of their design prior to final integration into an assembly thus understanding better the uncertainties of a previously developed shielding effectiveness mechanism.

Speaker: Dan Brooks (Aprel)

Daniel Brooks holds a Bachelor of Applied Science degree in Electrical Engineering from the University of Ottawa and diploma in Electronics Technology from Radio College of Canada. He has conducted research and development work as senior RF Engineer with Aprel Inc. where he has authored several published technical papers and presented his research to technical committees and Symposium of the IEC and EMC international organizations. His expertise is in the applied radiometrics of wireless propagation and numerical analysis of complex radiating structures. Dan is a hands-on type of person that enjoys taking theoretical ideas into the laboratory and moving them into real-world engineering designs.

“2. EMI Diagnostics – Using Real-Time Signal Analysis Technology”

The historically developed methods of measurements have limitations in today’s complex signal environment. Bursted and frequency hopping signals in an ever more crowded spectrum make identifying and isolating interference difficult, time consuming, and expensive. We will discuss how Real-Time technology can be used to rapidly capture and identify intermittent signals. Finally, we will look at a common diagnostics application and see how the capabilities of Real-Time Signal Analysis technology can be used to reduce troubleshooting time in EMC diagnostics.

Speaker: Bob Hiebert (Tektronix)

Mr. Hiebert is currently the director of business development for the Americas for Tektronix’s Sources and Analyzers business. In his 29 years in Test and Measurement he has had roles in marketing, engineering, and general management, working with a test and measurement technologies from DC to light.

“3. Future Standard Changes for IEC 61000 4-4 (EFT) & 4-5 (Surge)”

This presentation will explore future changes for the IEC 61000 EFT & Surge standards that may be occurring in the next few years. A brief review of EFT & Surge testing will also be included.

Speaker: Randy Johnson (Teseq)

Randy Johnson has been working in the EMC marketplace for over 30 years. He was co-owner of Loren Green Associates, a respected Manufacturer’s Rep company in Chicago, IL. Since 2004, Randy has been a Sales Manager at Schaffner Test Systems, now known as Teseq Inc. Randy was part of the management buyout of Teseq in 2007. Randy has been directly involved with customers in engineering/meeting their test equipment, systems & EMC software requirements for Commercial & Automotive applications.

“4. Trends in Anechoic Chamber Implementation – New materials and standards”

A general discussion regarding recent changes in anechoic chamber construction due to new anechoic materials and changes to international specifications. We all are driven by the new EMC regulations and requirements, which impact performance within the chambers. CISPR 16-1-4 will be discussed as having the most impact. Also reviewed will be MIL 461, DO-160 and CISPR 25 upgrades and the more common use of ferrite hybrid treatments.

Speaker: David Seabury (Panashield)

David Seabury has been working in the EMC marketplace for over 20 years. He founded IBEX Group in 1990 and in 1992 built the first all ferrite 3m chamber in the USA that met the new FCC NSA requirements. In 1992 he started a joint US operation with Chase EMC which was subsequently sold to Schaffner now TESEQ. From 2002 through 2010 he was a Senior Product Manager for ETS-Lindgren and in 2011 joined with Panashield as their Director of Sales. David has been directly involved with the design and construction of hundreds of anechoic chambers for commercial, military and aero-space applications

*Pre-registration is required to attend the seminar

Event Registration:

Event Registration for EMC Test Seminar at Tektronix -

We are honored to have Jerry Meyerhoff, an IEEE EMC Society Distinguished Lecturer as our guest speaker. He will be presenting “Why & How Does My Automotive Module Resonate?” In this presentation he will introduce a case study on a real automotive engine controller including correlation between simulation and measurement results. Alfredo Apolloni with Detroit Testing Laboratory, Inc will also present “Trends in Automotive Environmental and Accelerated Life Testing EV and PHEV Technologies” and David Seabury with Panashield, “Trends in Anechoic Chamber Implementation – New materials and standards.”

Abstract:

“1. Why & How Does My Automotive Module Resonate? “

- Introduction to General EMC Physics / Principles
- EMC Problem Solving Approach
- The Automotive Module & System Radiated Emissions Problem
- The Role of Modeling & Simulation
- Benefits & Cautions
- Benchmarking Automotive Module / System
- ElectroMagnetic Modeling Tool vs. Physical Measurements
- Correlation Observations
- Conclusions

Guest Speaker:

Jerry Meyerhoff
EMI/EMC Principal Consultant, JDM LABS LLC; IEEE EMC Society Distinguished Lecturer

Jerry Meyerhoff is currently the Principal of JDM LABS LLC, a consultancy which he started in 2009. He is devoted to assisting clients in optimizing designs for EMC, ElectroMagnetic Compatibility.

Previously Jerry was a Distinguished Member of the Technical Staff of Continental Automotive Systems, Deer Park, Illinois resulting from the acquisition of the former Motorola Automotive Group in 2006. He acted as a group-wide consultant in EMC design, serving multiple projects technologies and customers. Jerry’s prior 36 years at Motorola involved hardware design and development applied to radios, RF and analog circuits and refining digital microprocessor hardware with increasing emphasis on EMC.

Jerry earned a BSEE, with emphasis on communications technology, from the University of Illinois at Chicago (UIC) in 1970. He immediately joined Motorola’s Land Mobile Group. In 1971 he joined the US Army Reserve , was trained as a Fixed Station Transmitter Repairman 32C20 at Fort Monmouth, New Jersey serving the next 5 years in the 305th Psyop Bn. while pursuing his Motorola career. Jerry also took post graduate courses in RF design from IIT in Chicago.

Jerry holds multiple US patents and publications and was a member of Motorola’s Science Advisory Board Associates (SABA), a recognition afforded key members of the technical community.
http://www.linkedin.com/in/jerrymeyerhoff

Abstract:

“2. Trends in Automotive Environmental and Accelerated Life Testing EV and PHEV Technologies”

Electric and Plug in Hybrid vehicles are more critically dependent on electrical systems than any vehicle ever before. With such a high proportion of vehicle cost tied to the energy storage the calendar life and reliability of battery packs is a make or break proposition for vehicle manufacturers. In this presentation we discuss the current approaches in insuring the reliability of vehicle electrical systems though traditional life and environmental stress testing as well as accelerated life testing methods.

Guest Speaker:

Alfredo Apolloni
Detroit Testing Laboratory, Inc

Alfredo Apolloni has 22 years of experience in design and test engineering in the automotive and aerospace industries. Before joining DTL in 1990, Mr. Apolloni held engineering positions at Carnegie-Mellon Field Robotics Institute and Pratt &Whitney Aircraft Engines.

Mr. Apolloni has an B.S. degree in Mechanical Engineering from Carnegie-Mellon, M.S. degree in Electrical Engineering from Rensselaer Polytechnic Institute and an MBA from the University of Michigan. He is a member of many industry and economic development organizations including SAE and NDIA. He is currently the chairman of DTL.

Abstract:

“3.Trends in Anechoic Chamber Implementation – New materials and standards “

A general discussion regarding recent changes in anechoic chamber construction due to new anechoic materials and changes to international specifications. We all are driven by the new EMC regulations and requirements, which impact performance within the chambers. CISPR 16-1-4 will be discussed as having the most impact. Also reviewed will be MIL 461, DO-160 and CISPR 25 upgrades and the more common use of ferrite hybrid treatments.

Guest Speaker:

David Seabury has been working in the EMC marketplace for over 20 years. He founded IBEX Group in 1990 and in 1992 built the first all ferrite 3m chamber in the USA that met the new FCC NSA requirements. In 1992 he started a joint US operation with Chase EMC which was subsequently sold to Schaffner now TESEQ. From 2002 through 2010 he was a Senior Product Manager for ETS-Lindgren and in 2011 joined with Panashield as their Director of Sales. David has been directly involved with the design and construction of hundreds of anechoic chambers for commercial, military and aero-space applications

*Pre-registration is required to attend the seminar

EVENT:

Guest Speakers:	Jerry Meyerhoff (JDM LABS LLC), Alfredo Apolloni (Detroit Testing Laboratory, Inc), David Seabury (Panashield)
Date:	March 13, 2012
EMC Seminar:	10:00 am – 2:00 pm
Venue:	CKC Labs: 1120 Fulton Place | Fremont, CA 94539 | Map

AGENDA:

9:30 am – 10:00 am	Registration
10:00 am – 10:10 am	“CKC Labs Introduction: Services and Capabilities”
10:10 am – 11:30 am	“Why & How Does My Automotive Module Resonate” by Jerry Meyerhoff
11:30 am – 12:00 pm	“Trends in Anechoic Chamber Implementation – New materials and standards” by David Seabury
12:00 pm – 1:00 pm	Lunch and lab tour
1:00 pm – 2:00pm	“Trends in Automotive Environmental and Accelerated Life Testing EV and PHEV Technologies” by Alfredo Apolloni

EVENT REGISTRATION

Event Registration for EMC Seminar at CKC Labs -

We are honored to have Stuart Nicol with Aprel as our guest speaker. He will be presenting “Test Applications Using an Automated Near Field Detection System”. In addition APREL will demonstrate the features and functions of EM-ISight-2 automated near field scanning system which will operate from 10kHz to 20GHz. The demonstrations will be made using applications relevant to research, test, measurement and design optimization. EM-ISight-2 will incorporate the latest version of Tektronix RSA6120A real time spectrum analyzer where a complete demonstration of unique features included in the APRELEM-ISight software package will be shown. We will also have David Huynh with Tektronix present “EMI Diagnostics:Using Real-time Signal Analysis Technology” and Yoshi Fukawa with TechDream on “EMI Reduction Methodology using EMIStream”.

Abstract:

“1. Test Applications Using an Automated Near Field Detection System”

EM-ISight is a near-field EMC scanning system that can be used as an alternative for costly pre-compliance chambers and for de-bugging assemblies for noise sources. This webinar will cover some of the test applications which EM-ISight has been used and shown success in solving noise / emissions on complex electronic assemblies. Introduction to IEC-61967 and the application of EM-ISight and using EM-ISight to conduct de-sense testing for cellular and AGPS modes of operation shall be presented.

Guest Speaker:

Stuart Nicol
Aprel

Stuart Nicol has worked within the field of high technology/telecommunications for over 16 years both in Europe and North America. He has been the lead in all major automated system development programs at APREL including SAR (Specific Absorption Rate). HAC (Hearing Aid Compatibility) and EM-ISight (near field scanning). He has held many positions within the international standards development committees and is the current chairman for the Canadian delegation of IEC TC-106, he received his degree in the United Kingdom (electronic and manufacturing engineering) and is the CEO of APREL.

“2. EMI Diagnostics:Using Real-time Signal Analysis Technology”

Electromagnetic emissions and interference (EMI) are by their very nature unwanted, semi-random, and often are detected at the most inopportune time. Traditional swept spectrum analyzers require narrow resolution bandwidth settings in order to detect the lowest level signals emitted by a device under test. When swept across wide frequency ranges to perform emission measurements, swept spectrum analyzers not only take many minutes, but they also might not display random occurrences that appear within the spectrum if the analyzer “missed” the moment at which the random signal appeared. Tektronix’s patented DPX technology allows engineers to see signals within signals and capture live RF the moment signals appear. Revolutionary Tektronix Real Time Spectrum Analyzer (RSA) technology also makes low level emissions and spurious measurements up to 10x faster than traditional swept spectrum analyzers, which makes the RSA an ideal diagnostic tool to capture, trigger, and analyze sources of unwanted EMI.

Guest Speaker:

David Huynh
Tektronix

David Huynh has worked in the Wireless Communication space since 2005. His past roles entailed Field Applications and Product Marketing Engineering at Agilent Technologies. He is currently a Business Development Manager with Tektronix. David received his BSEE and MSEE from the University of California, San Diego and Stanford University respectively. He also recently obtained his MBA from the Harvard Business School.

About EMT Labs
EMT is one stop for test and international approval lab . We offer ITE, medical, wireless telephone interface product testing and get international approval in a timely manner.

*Pre-registration is required to attend the seminar

EVENT:

Guest Speakers:	Stuart Nicol (Aprel), David Huynh (Tektronix)
Date:	February 23-24, 2012
Open House:	10:00am – 4:00pm
Lunch Workshop:	11:30am – 1:00pm
Venue:	EMT Labs: 1547 Plymouth Street Mountain View, CA 94043 | Map

AGENDA:

10:00am – 11:30am	Open House
11:30am – 11:40am	“EMT Labs Introduction: Services and Capabilities”
11:40am – 12:25pm	“Test Application Using an Automated Near Field Detection System” by Stuart Nicole
12:25pm – 12:45pm	“EMI Diagnostics:Using Real-time Signal Analysis Technology” by David Huynh
12:45pm – 1:15pm	“EMI Reduction Methodology using EMIStream” by Yoshi Fukawa
1:15pm – 4:00pm	Open House

EVENT REGISTRATION

Event Registration for EMC Open House at EMT Labs -

We exhibited at the EPEPS 2011 Conference which was held at the Doubletree Hotel in San Jose from October 24th to 25th. EPEPS is the premier international conference on advanced and emerging issues in electrical modeling, analysis and design of electronic interconnections, packages and systems.

- Test Applications Using an Automated Near Field Detection System -

We are pleased to invite you to “EMC Technical Webinar from Aprel” a webinar which will take place on Friday, November 18th from 10 am to 11:30 am (PST). The webinar is free to attend.

We are honored to have Stuart Nicol with Aprel as our guest speaker. He will be presenting “Test Applications Using an Automated Near Field Detection System”

Abstract:

“Test Applications Using an Automated Near Field Detection System”
Stuart Nicol : Aprel

EM-ISight is a near-field EMC scanning system that can be used as an alternative for costly pre-compliance chambers and for de-bugging assemblies for noise sources. This webinar will cover some of the test applications which EM-ISight has been used and shown success in solving noise / emissions on complex electronic assemblies. Introduction to IEC-61967 and the application of EM-ISight and using EM-ISight to conduct de-sense testing for cellular and AGPS modes of operation shall be presented.

Guest Speaker:

Stuart Nicol
Aprel

Stuart Nicol has worked within the field of high technology/telecommunications for over 16 years both in Europe and North America. He has been the lead in all major automated system development programs at APREL including SAR (Specific Absorption Rate). HAC (Hearing Aid Compatibility) and EM-ISight (near field scanning). He has held many positions within the international standards development committees and is the current chairman for the Canadian delegation of IEC TC-106, he received his degree in the United Kingdom (electronic and manufacturing engineering) and is the CEO of APREL.

*Pre-registration is required to attend the seminar

Event:

Guest Speaker:	Stuart Nicol (Aprel)
Date:	November 18, 2011
Webinar:	10:00 am – 11:30 am (PST)

Agenda:

10:00 am – 11:00 am	Test Applications Using an Automated Near Field Detection System
11:00 am – 11:30 am	Q & A